Magnetic Image Sensor (MIS)

Magnetic Image Sensor (MIS), is equipped with Tunnel Magneto Resistance. For the purpose of changing the resistance value in response to the strength of magnetism. Therefore, magnetic current imaging uses the magnetic fields produced by currents in electronic devices to obtain images of those currents

Therefore, it is used for high resolution and high-speed detection of magnetic patterns. Furthermore, it can be used to scan security lines of banknotes, checks, and tickets coated with magnetic ink, etc. The product features include high resolution up to 100DPI, low noise, simple signal processing, and easy assembly. Therefore, The MIS is most suitable for high-quality magnetic image capturing.

Magnetic current imaging is one technique that can provide failure analysts. Nevertheless, a tool to help overcome some of the hurdles involved in fault isolation of present and next-generation semiconductor devices. For example, a sensitive magnetic sensor can image currents in integrated circuits via the magnetic fields produced. Unlike thermal, optical, ion, or electron beam techniques, low-frequency magnetic fields are not affected by the materials Inman IC or package. Therefore, imaging can be performed from both the front or backside of a device through many layers of metal or packaging materials. These images can reveal the locations of shorts and other current anomalies at both the die and package levels. This technique has applications in fault isolation, design verification, and defective component isolation in full assemblies.

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Magnetic Image Sensor (MIS) Specs